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Ultramicroscopy|February 22, 2011
Minimization of focused ion beam damage in nanostructured polymer thin filmsSuhan Kim, Moon Jeong Park, Nitash P Balsara, et al.Ultramicroscopy|February 22, 2011
Characterising the surface and interior chemistry of core-shell nanoparticles using scanning transmission electron microscopyB G Mendis, A J CravenUltramicroscopy|February 22, 2011
Quantitative atom column position analysis at the incommensurate interfaces of a (PbS)(1.14)NbS(2) misfit layered compound with aberration-corrected HRTEMM Garbrecht, E Spiecker, K Tillmann, et al.Ultramicroscopy|February 19, 2011
Energy-filtered transmission electron microscopy of biological samples on highly transparent carbon nanomembranesDaniel Rhinow, Matthias Büenfeld, Nils-Eike Weber, et al.Ultramicroscopy|February 4, 2011
Atomic-scale distribution of impurities in CuInSe2-based thin-film solar cellsO Cojocaru-Mirédin, P Choi, R Wuerz, et al.Ultramicroscopy|October 6, 2009
Validation and generalization of a method for precise size measurements of metal nanoclusters on supportsB W Reed, D G Morgan, N L Okamoto, et al.Ultramicroscopy|December 17, 2010
Correlated ion analysis and the interpretation of atom probe mass spectraD W SaxeyUltramicroscopy|December 17, 2010
Analysis of clustering in Al-Mg-Si alloy by density spectrum analysis of atom probe dataN Wanderka, N Lazarev, C S T Chang, et al.Ultramicroscopy|December 17, 2010
Segregation of solute elements at grain boundaries in an ultrafine grained Al-Zn-Mg-Cu alloyGang Sha, Lan Yao, Xiaozhou Liao, et al.Ultramicroscopy|December 17, 2010
Some aspects of the field evaporation behaviour of GaSbM Müller, D W Saxey, G D W Smith, et al.Pageof 460