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Ultramicroscopy|July 6, 2018
Characterization of single-atom catalysts by EELS and EDX spectroscopyR F Egerton, M WatanabeUltramicroscopy|July 31, 2018
Analysis of nano-crystals: Evaluation of heavy metal-embedded biological specimen by high voltage electron microscopyHyeongseop Jeong, Seung Jo Yoo, Jonghan Won, et al.Ultramicroscopy|September 9, 2018
In situ atomic scale mechanisms of strain-induced twin boundary shear to high angle grain boundary in nanocrystalline PtLihua Wang, Jiao Teng, Yu Wu, et al.Ultramicroscopy|August 17, 2018
MS-STEM-FEM: A parallelized multi-slice fluctuation TEM simulation toolNicholas H Julian, Tian T Li, Robert E Rudd, et al.Ultramicroscopy|July 2, 1999
Towards single atom analysis of biological structuresR D Leapman, N W RizzoUltramicroscopy|January 31, 2006
Polarization dependence in ELNES: influence of probe convergence, collector aperture and electron beam incidence angleJ C Le Bossé, T Epicier, B JouffreyUltramicroscopy|February 2, 2006
Contact mechanics and tip shape in AFM-based nanomechanical measurementsMalgorzata Kopycinska-Müller, Roy H Geiss, Donna C HurleyUltramicroscopy|December 14, 2007
Multivariate statistical approach to electron backscattered diffractionLuke N Brewer, Paul G Kotula, Joseph R MichaelUltramicroscopy|December 18, 2007
3-D reconstruction of the atomic positions in a simulated gold nanocrystal based on discrete tomography: prospects of atomic resolution electron tomographyJ R Jinschek, K J Batenburg, H A Calderon, et al.Ultramicroscopy|December 31, 2005
Specimen preparation for electron holography of semiconductor devicesPetr Formanek, Eberhard BugielPageof 460