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Ultramicroscopy|January 3, 2006
Energy loss spectroscopic profiling across linear interfaces: the example of amorphous carbon superlatticesV Stolojan, P Moreau, S J Henley, et al.Ultramicroscopy|July 1, 1996
A common-lines based method for determining orientations for N > 3 particle projections simultaneouslyP A Penczek, J Zhu, J FrankUltramicroscopy|April 1, 1977
Motif detection in quantum noise-limited electron micrographs by cross-correlationW O Saxton, J FrankUltramicroscopy|April 1, 1977
High resolution bright field electron microscopy of biological specimensB V JohansenUltramicroscopy|April 1, 1977
A reflection on partial coherence in electron microscopyJ Fertig, H RoseUltramicroscopy|December 7, 2007
A novel "ghost"-free tomographic image reconstruction method applicable to rotary-shadowed replica specimensNorio Baba, Eisaku KatayamaUltramicroscopy|October 1, 1991
Electron crystallography at atomic resolution: ab initio structure analysis of copper perchlorophthalocyanineD L Dorset, W F Tivol, J N TurnerUltramicroscopy|December 7, 2007
Diffracted phase and amplitude measurements by energy-filtered convergent-beam holography (CHEF)F Houdellier, M J HÿtchUltramicroscopy|December 11, 2007
Imaging of intracellular spherical lamellar structures and tissue gross morphology by a focused ion beam/scanning electron microscope (FIB/SEM)Damjana Drobne, Marziale Milani, Vladka Leser, et al.Pageof 460