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Ultramicroscopy|September 29, 2004
Radiation damage in coronene, rubrene and p-terphenyl, measured for incident electrons of kinetic energy between 100 and 200 kevP Li, R F EgertonUltramicroscopy|September 29, 2004
Electron-acoustic and surface electron beam induced voltage signal formation in scanning electron microscopy analysis of semiconducting samplesW K Wong, E I Rau, J T L ThongUltramicroscopy|September 29, 2004
Surface charge compensation for a highly charged ion emission microscopeJ W McDonald, A V Hamza, M W Newman, et al.Ultramicroscopy|June 29, 2004
A Au82Si18 liquid metal field-ion emitter for the production of Si ions: fundamental properties and mechanismsL Bischoff, G L R Mair, C J Aidinis, et al.Ultramicroscopy|December 1, 1994
Analysis of transient structures by cryo-microscopy combined with rapid mixing of spray dropletsJ Berriman, N UnwinUltramicroscopy|December 1, 1994
Variable pitch in frozen-hydrated sickle hemoglobin fibers: an image analysis model studyM R Lewis, L J Gross, R JosephsUltramicroscopy|March 1, 1994
The ribosome at improved resolution: new techniques for merging and orientation refinement in 3D cryo-electron microscopy of biological particlesP A Penczek, R A Grassucci, J FrankUltramicroscopy|October 18, 2005
Atomic-precision determination of the reconstruction of a 90 degree tilt boundary in YBa2Cu3O7-delta by aberration corrected HRTEML Houben, A Thust, K UrbanUltramicroscopy|April 11, 2002
A comparison between three-dimensional and two-dimensional grain boundary plane analysisV Randle, H DaviesUltramicroscopy|April 11, 2002
Dual-color 4Pi-confocal microscopy with 3D-resolution in the 100 nm rangeH Kano, S Jakobs, M Nagorni, et al.Pageof 460