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Ultramicroscopy|February 24, 2001
Intermittent contact AFM using the higher modes of weak cantileverA Ulcinas, V SnitkaUltramicroscopy|February 24, 2001
Role of ripening and defects in the formation of mesotaxial cobalt-disilicide layersO Hul'ko, J P McCaffrey, M Zinke-AllmangUltramicroscopy|February 24, 2001
Nanotribology of Si oxide layers on Si by atomic force microscopyW C Moon, T Yoshinobu, H IwasakiUltramicroscopy|February 24, 2001
Chemical force microscopy of self-assembled monolayers on sputtered gold films patterned by phase separationM Fujihira, Y Tani, M Furugori, et al.Ultramicroscopy|February 24, 2001
Atomic force microscopy can be used to mechanically stimulate osteoblasts and evaluate cellular strain distributionsG T Charras, P P Lehenkari, M A HortonUltramicroscopy|September 5, 2002
Surface potential contrasts between silicon surfaces covered and uncovered with an organosilane self-assembled monolayerKazuyuki Hayashi, Nagahiro Saito, Hiroyuki Sugimura, et al.Ultramicroscopy|September 5, 2002
Orientation and relocation of biphenyl thiol self-assembled monolayers under slidingHuiwen Liu, Bharat BhushanUltramicroscopy|September 5, 2002
Combination of AFM with an objective-type total internal reflection fluorescence microscope (TIRFM) for nanomanipulation of single cellsShuhei Nishida, Yutaka Funabashi, Atsushi IkaiUltramicroscopy|September 5, 2002
Immobilisation of Semliki forest virus for atomic force microscopyM Moloney, L McDonnell, H O'SheaUltramicroscopy|September 5, 2002
Self-sensing piezoresistive cantilever and its magnetic force microscopy applicationsHiroshi Takahashi, Kazunori Ando, Yoshiharu ShirakawabePageof 460