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Ultramicroscopy|February 11, 2014
Optimized imaging using non-rigid registrationBenjamin Berkels, Peter Binev, Douglas A Blom, et al.Ultramicroscopy|February 12, 2014
Separation of electrostatic and magnetic phase shifts using a modified transport-of-intensity equationE Humphrey, C Phatak, A K Petford-Long, et al.Ultramicroscopy|February 4, 2014
Dopant mapping in thin FIB prepared silicon samples by Off-Axis Electron HolographyAdi Pantzer, Atsmon Vakahy, Zohar Eliyahou, et al.Ultramicroscopy|March 18, 2008
Optimization of specimen preparation of thin cell section for AFM observationXinhui Li, Tong Ji, Jun Hu, et al.Ultramicroscopy|March 18, 2008
Kelvin force microscopy at the second cantilever resonance: an out-of-vacuum crosstalk compensation setupH Diesinger, D Deresmes, J-P Nys, et al.Ultramicroscopy|November 5, 2018
Temperature calibration of TEM specimen heating holders by isothermal sublimation of silver nanocubesSriram Vijayan, Mark AindowUltramicroscopy|March 16, 2017
Effects of small-angle mistilts on dopant visibility in ADF-STEM imaging of nanocrystalsJacob T Held, Samuel Duncan, K Andre MkhoyanUltramicroscopy|March 16, 2017
X-ray absorption in pillar shaped transmission electron microscopy specimensH Bender, F Seidel, P Favia, et al.Ultramicroscopy|April 4, 2017
Comparing Fourier optics and contrast transfer function modeling of image formation in low energy electron microscopyK M Yu, A Locatelli, M S AltmanUltramicroscopy|April 10, 2017
Laboratory based X-ray photoemission core-level spectromicroscopy of resistive oxide memoriesDaniel M Gottlob, Eugénie Martinez, Claire Mathieu, et al.Pageof 460