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Ultramicroscopy|March 18, 2017
Optimizing experimental parameters for the projection requirement in HAADF-STEM tomographyR Aveyard, Z Zhong, K J Batenburg, et al.
Ultramicroscopy|January 31, 2017
Optimising electron microscopy experiment through electron optics simulationY Kubo, C Gatel, E Snoeck, et al.
Ultramicroscopy|July 15, 2019
Speeding up the extended Kalman filter approach for denoising XMCD movies of fast magnetization dynamicsM Fähnle, G Schütz
Ultramicroscopy|March 27, 2019
Magnetic domain wall contrast under zero domain contrast conditions in spin polarized low energy electron microscopyChao Zhou, Gong Chen, Jia Xu, et al.
Ultramicroscopy|November 16, 2018
Multi-modal plasma focused ion beam serial section tomography of an organic paint coatingXiangli Zhong, M Grace Burke, Philip J Withers, et al.
Ultramicroscopy|November 16, 2018
Quantitative EMCD by use of a double aperture for simultaneous acquisition of EELSHasan Ali, Tobias Warnatz, Ling Xie, et al.
Ultramicroscopy|January 23, 2017
Structure and chemistry of epitaxial ceria thin films on yttria-stabilized zirconia substrates, studied by high resolution electron microscopyRobert Sinclair, Sang Chul Lee, Yezhou Shi, et al.
Ultramicroscopy|April 8, 2017
Non-contact scanning probe technique for electric field measurements based on nanowire field-effect transistorA S Trifonov, D E Presnov, I V Bozhev, et al.
Ultramicroscopy|June 14, 2008
Characterization of nanowires and molecular switches with scanning tunneling microscopyFredy Zypman
Ultramicroscopy|June 14, 2008
Fast displacement and structural transition of cyclohexanethiol self-assembled monolayers by octanethiols on Au (111)Seungwook Kwon, Youngsik Choi, Jungseok Choi, et al.
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