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Ultramicroscopy|August 16, 2020
Chemical kinetics for operando electron microscopy of catalysts: 3D modeling of gas and temperature distributions during catalytic reactionsJoshua L Vincent, Jarod W Vance, Jayse T Langdon, et al.Ultramicroscopy|April 20, 2021
Effect of sample thinning on strains and lattice rotations measured from Transmission Kikuchi diffraction in the SEMPhani S Karamched, Naganand Saravanan, Jack C Haley, et al.Ultramicroscopy|July 31, 2025
Resonant scattering in low energy electron diffraction: Bi/Ni(111)Bene Poelsema, Martina Tsvetanova, Harold J W Zandvliet, et al.Ultramicroscopy|July 31, 2025
Observation of domain morphology in twisted antimonene layers via moiré superlattice contrast with low energy electron microscopyMariusz Gołębiowski, Piotr Dróżdż, Ryszard ZdybUltramicroscopy|November 13, 2025
Evaluation of electron threshold energy for predicting radiation damage in transmission electron microscopyYupeng Yin, Ruiqi Zhan, Yufeng Du, et al.Ultramicroscopy|October 29, 2025
Studying the effect of EDAI passivation on surface defects in triple cation mixed halide perovskite with PEEMPrajakta Kokate, Yorrick Boeije, Ganbaatar Tumen-Ulzii, et al.Ultramicroscopy|July 10, 2025
Data-efficient 4D-STEM in SEM: Beyond 2D materials to metallic materialsUjjval Bansal, Amit Sharma, Barbara Putz, et al.Ultramicroscopy|June 24, 2025
TEM-EDS microanalysis: Comparison between different electron sources, accelerating voltages and detection systemsRoberto Conconi, María Del Mar Abad Ortega, Fernando Nieto, et al.Ultramicroscopy|June 24, 2025
Differences between differential phase contrast and electron holographic measurements of a GaN p-n junctionLaura NiermannUltramicroscopy|September 20, 2025
High-Resolution EELS in an aberration-corrected LEEM: Design of electrostatic transfer lenses for hemispherical filtersVincent Lemelin, Richard MartelPageof 460