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Ultramicroscopy|June 19, 2026
Temperature-dependent mean inner potential of polystyrene spheres measured using off-axis electron holographyYan Lu, Peng-Han Lu, Fengshan Zheng, et al.
Ultramicroscopy|June 23, 2026
Brightness optimization in a 200 keV DTEM source by geometry-driven aberration suppressionPaul Denham, Pietro Musumeci, Daniel J Masiel, et al.
Ultramicroscopy|January 1, 1995
Proposal of alignment-independent classification of electron microscopic images with helical symmetry and its application to reconstituted thin filaments os skeletal muscleT Ishikawa, T Wakabayashi
Ultramicroscopy|July 3, 2026
Determination of the structure of the tertiary phase in the alloy Al10Mo10Nb10Ta10Ti30Zr30 using convergent beam electron diffractionP L O'Kelly, J K Jensen, B A Welk, et al.
Ultramicroscopy|July 12, 2026
Decoupling composition and band gap in κ-Ga2O3 heterostructures via STEM-EELSAnnett Thøgersen, Georg Muntingh, Lasse Vines, et al.
Ultramicroscopy|September 10, 2013
Dynamic scattering theory for dark-field electron holography of 3D strain fieldsAxel Lubk, Elsa Javon, Nikolay Cherkashin, et al.
Ultramicroscopy|March 13, 2013
Atom probe tomography of thermally grown oxide scale on FeCrAlFang Liu, Krystyna Stiller
Ultramicroscopy|August 30, 2008
Preparation of TEM samples for hard ceramic powdersQiang Xu, Vikas Kumar, Tom de Kruijff, et al.
Ultramicroscopy|April 11, 2002
Analysis of high resolution transmission electron microscope images of crystalline-amorphous interfacesN I Borgardt, B Plikat, M Seibt, et al.
Ultramicroscopy|October 7, 2019
Indexing electron backscatter diffraction patterns with a refined template matching approachA Foden, D M Collins, A J Wilkinson, et al.
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