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Ultramicroscopy|November 4, 2026
Thickness determination from EDXS maps acquired in a transmission electron microscope and its application for shape reconstruction of nanoparticlesRadian Popescu, Dagmar Gerthsen, Simon Hettler, et al.Ultramicroscopy|June 13, 2003
Light-illuminated STM studies on photo-absorption in InAs nanowiresTakuji Takahashi, Kan Takada, Misaichi TakeuchiUltramicroscopy|June 13, 2003
Nano-scale imaging of chromosomes and DNA by scanning near-field optical/atomic force microscopyTomoyuki Yoshino, Shigeru Sugiyama, Shoji Hagiwara, et al.Ultramicroscopy|June 13, 2003
Probing nanoscale surface enhanced Raman-scattering fluctuation dynamics using correlated AFM and confocal ultramicroscopyYung Doug Suh, Gregory K Schenter, Leyun Zhu, et al.Ultramicroscopy|June 13, 2003
AFM imaging of bacteria in liquid media immobilized on gelatin coated mica surfacesM J Doktycz, C J Sullivan, P R Hoyt, et al.Ultramicroscopy|June 13, 2003
Lateral force microscopy profiles for amorphous potentialsA M F Rivas, R R M Zamora, R PrioliUltramicroscopy|March 8, 2003
A method for estimating the CTF in electron microscopy based on ARMA models and parameter adjustmentJ A Velázquez-Muriel, C O S Sorzano, J J Fernández, et al.Ultramicroscopy|July 23, 2003
Localization in elastic and inelastic scatteringA R Lupini, S J PennycookUltramicroscopy|July 23, 2003
Layer-doubling method in ADF-STEM image simulationK Mitsuishi, M Takeguchi, Y Toda, et al.Pageof 460