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Ultramicroscopy|January 15, 2011
Atom probe tomography of reactor pressure vessel steels: an analysis of data integrityJ M Hyde, M G Burke, B Gault, et al.Ultramicroscopy|January 11, 2011
Effect of analysis direction on the measurement of interfacial mixing in thin metal layers with atom probe tomographyD J Larson, T J Prosa, B P Geiser, et al.Ultramicroscopy|January 11, 2011
Comparison of radiation-induced segregation in ultrafine-grained and conventional 316 austenitic stainless steelsA Etienne, B Radiguet, N J Cunningham, et al.Ultramicroscopy|December 31, 2010
Quantitative atom probe analyses of rare-earth-doped ceria by femtosecond pulsed laserF Li, T Ohkubo, Y M Chen, et al.Ultramicroscopy|January 4, 2011
Optimized conditions for imaging the effects of bonding charge density in electron microscopyJ Ciston, J S Kim, S J Haigh, et al.Ultramicroscopy|December 24, 2010
Broadening the applications of the atom probe technique by ultraviolet femtosecond laserK Hono, T Ohkubo, Y M Chen, et al.Ultramicroscopy|December 24, 2010
Revisiting Bragg's X-ray microscope: scatter based optical transient grating detection of pulsed ionising radiationWilfred K Fullagar, David M Paganin, Chris J HallUltramicroscopy|December 28, 2010
Effects of higher oscillation modes on TM-AFM measurementsHossein Nejat Pishkenari, Ali MeghdariUltramicroscopy|December 28, 2010
Quantitative EELS analysis of zirconium alloy metal/oxide interfacesNa Ni, Sergio Lozano-Perez, John Sykes, et al.Ultramicroscopy|March 1, 2011
Coherent low-energy electron diffraction on individual nanometer sized objectsElvira Steinwand, Jean-Nicolas Longchamp, Hans-Werner FinkPageof 460