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Ultramicroscopy|November 1, 1992
Emission microscopy and related techniques: resolution in photoelectron microscopy, low energy electron microscopy and mirror electron microscopyG F Rempfer, O H GriffithUltramicroscopy|March 19, 2005
Application of photon scanning tunneling microscope to measure optical near field for atom manipulationS M IftiquarUltramicroscopy|February 8, 2005
Computational methods to produce enhanced images out of given SNOM raw dataF Kiendl, G GüntherodtUltramicroscopy|April 20, 2004
A new method for the determination of the wave aberration function for high-resolution TEM.; 2. Measurement of the antisymmetric aberrationsR R Meyer, A I Kirkland, W O SaxtonUltramicroscopy|April 20, 2004
Role of surface amorphous film in high-resolution high-angle annular dark field STEM imagingT Yamazaki, K Watanabe, N Nakanishi, et al.Ultramicroscopy|April 20, 2004
Reproducible lateral force microscopy measurements for quantitative comparisons of the frictional and chemical properties of nanostructuresM W Such, D E Kramer, M C HersamUltramicroscopy|July 3, 2004
Mapping of enzyme activity by detection of enzymatic products during AFM imaging with integrated SECM-AFM probesC Kranz, A Kueng, A Lugstein, et al.Ultramicroscopy|July 3, 2004
Molecular adsorption: early stage surface explorationDebra J Brayshaw, Monica Berry, Terence J McMasterUltramicroscopy|July 3, 2004
Magnetic field detection for current evaluation by magnetic force microscopyTakuji Takahashi, Daisuke SaidaUltramicroscopy|July 3, 2004
Velocity dependent friction laws in contact mode atomic force microscopyRobert W Stark, Georg Schitter, Andreas StemmerPageof 460