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Ultramicroscopy|October 8, 2018
Three-dimensional reconstruction and quantification of dislocation substructures from transmission electron microscopy stereo pairsLeonardo Agudo Jácome, Kai Pöthkow, Olaf Paetsch, et al.
Ultramicroscopy|August 10, 2018
Development of in situ optical-electrical MEMS platform for semiconductor characterizationSonghua Cai, Chenyi Gu, Yifan Wei, et al.
Ultramicroscopy|August 10, 2018
Wavelet transform-based electron tomography measurement of buried interface roughnessDarren Homeniuk, Marek Malac, Misa Hayashida
Ultramicroscopy|October 20, 1999
Optimization of adhesion mode atomic force microscopy resolves individual molecules in topography and adhesionO H Willemsen, M M Snel, S J van Noort, et al.
Ultramicroscopy|December 1, 1976
High resolution shadowing for electron microscopy by sputter depositionK Adachi, K Hojou, M Katoh, et al.
Ultramicroscopy|December 1, 1976
Scanning transmission electron microscopy of thin specimensJ M Cowley
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