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Ultramicroscopy|March 2, 2010
Reply to comment by Maurice et al. in response to "Bragg's Law Diffraction Simulations for Electron Backscatter Diffraction Analysis"Josh Kacher, Jay Basinger, Brent L Adams, et al.Ultramicroscopy|February 6, 2010
Probing material properties of polymeric surface layers with tapping mode AFM: which cantilever spring constant, tapping amplitude and amplitude set point gives good image contrast and minimal surface damage?Esben Thormann, Torbjörn Pettersson, John Kettle, et al.Ultramicroscopy|March 6, 2010
Higher order structure of short immunostimulatory oligonucleotides studied by atomic force microscopyDionne C G Klein, Eicke Latz, Terje Espevik, et al.Ultramicroscopy|March 9, 2010
Contrast inversion in non-contact Dynamic Scanning Force Microscopy: what is high and what is low?E Palacios-Lidón, C Munuera, C Ocal, et al.Ultramicroscopy|December 29, 2009
Image deformation in field ion microscopy of faceted crystalsDaniel Niewieczerzał, Czesław Oleksy, Andrzej SzczepkowiczUltramicroscopy|September 26, 2016
Angle selective backscattered electron contrast in the low-voltage scanning electron microscope: Simulation and experiment for polymersQ Wan, R C Masters, D Lidzey, et al.Ultramicroscopy|April 17, 2018
Using molecular dynamics for multislice TEM simulation of thermal diffuse scattering in AlGaNFlorian F Krause, Dennis Bredemeier, Marco Schowalter, et al.Ultramicroscopy|April 15, 2018
Evaluation of noise and blur effects with SIRT-FISTA-TV reconstruction algorithm: Application to fast environmental transmission electron tomographyHussein Banjak, Thomas Grenier, Thierry Epicier, et al.Ultramicroscopy|April 7, 2018
On the retrieval of crystallographic information from atom probe microscopy data via signal mapping from the detector coordinate spaceNathan D Wallace, Anna V Ceguerra, Andrew J Breen, et al.Pageof 460