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Ultramicroscopy|July 7, 2017
Imaging with straight-edge phase plates in the TEMC J Edgcombe
Ultramicroscopy|July 11, 2017
Measuring nanometre-scale electric fields in scanning transmission electron microscopy using segmented detectorsH G Brown, N Shibata, H Sasaki, et al.
Ultramicroscopy|July 11, 2017
A direct comparison of experimental methods to measure dimensions of synthetic nanoparticlesP Eaton, P Quaresma, C Soares, et al.
Ultramicroscopy|July 1, 2017
Bandgap measurement of high refractive index materials by off-axis EELSMaryam Vatanparast, Ricardo Egoavil, Turid W Reenaas, et al.
Ultramicroscopy|June 28, 2017
Gated interference for time-resolved electron holographyT Niermann, M Lehmann, T Wagner
Ultramicroscopy|July 1, 1992
Streptavidin binding observed with an atomic force microscopeA L Weisenhorn, F J Schmitt, W Knoll, et al.
Ultramicroscopy|July 1, 1992
Molecular-resolution images of aspirin crystals with atomic force microscopyN Masaki, K Machida, H Kado, et al.
Ultramicroscopy|July 1, 1992
Scanning force microscopy and cryo-electron microscopy of tobacco mosaic virus as a test specimenF Zenhausern, M Adrian, R Emch, et al.
Ultramicroscopy|January 23, 2010
HOLZ lines splitting on SiGe/Si relaxed samples: analytical solutions for the kinematical equationC Alfonso, L Alexandre, Ch Leroux, et al.
Ultramicroscopy|June 15, 2018
Modelling electron beam induced dynamics in metallic nanoclustersDaniel Knez, Martin Schnedlitz, Maximilian Lasserus, et al.
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