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Ultramicroscopy|June 16, 2007
Thermal response of domains in cardiolipin content bilayersOscar Domènech, Antoni Morros, Miquel E Cabañas, et al.Ultramicroscopy|June 19, 2007
Classification of heterogeneous electron microscopic projections into homogeneous subsetsG T Herman, M KalinowskiUltramicroscopy|October 9, 2007
Effects of specimen tilt in ADF-STEM imaging of a-Si/c-Si interfacesZ Yu, D A Muller, J SilcoxUltramicroscopy|November 27, 2007
Maximum diameter of the rod-shaped specimen for transmission electron microtomography without the "missing wedge"Mitsuro Kato, Noboru Kawase, Takeshi Kaneko, et al.Ultramicroscopy|November 27, 2007
The Fresnel effect of a defocused biprism on the fringes in inelastic holographyJo Verbeeck, Giovanni Bertoni, Peter SchattschneiderUltramicroscopy|November 27, 2007
Study of the sensitivity of the first four flexural modes of an AFM cantilever with a sidewall probeWin-Jin Chang, Haw-Long Lee, Terry Yuan-Fang ChenUltramicroscopy|August 12, 2008
On some contrast reversals in SEM: application to metal/insulator systemsJacques CazauxUltramicroscopy|May 1, 1991
A computer-aided control, design and image-processing system for electron microscopesD L Habliston, B Baker, O H Griffith, et al.Ultramicroscopy|October 14, 2008
A more comprehensive modeling of atomic force microscope cantileverM H Mahdavi, A Farshidianfar, M Tahani, et al.Ultramicroscopy|September 5, 2008
Low-dose performance of parallel-beam nanodiffractionMarek Malac, Marco Beleggia, Yoshifumi Taniguchi, et al.Pageof 460