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Ultramicroscopy|April 27, 2000
Construction and characterization of the fringe field monochromator for a field emission gunMook, KruitUltramicroscopy|April 27, 2000
Zero-loss image formation and modified contrast transfer theory in EFTEMI Angert, E Majorovits, R R SchröderUltramicroscopy|April 27, 2000
Electron microscope characterization of CdSe/ZnSe quantum dots based on molecular dynamics structure relaxationsScheerschmidt, Conrad, Kirmse, et al.Ultramicroscopy|January 11, 2000
A robust algorithm for the reconstruction of helical filaments using single-particle methodsE H EgelmanUltramicroscopy|January 11, 2000
Chemical etching of optical fibre tips--experiment and modelB A Puygranier, P DawsonUltramicroscopy|July 21, 2001
Image-spectroscopy--II. The removal of plural scattering from extended energy-filtered series by Fourier deconvolutionP J Thomas, P A MidgleyUltramicroscopy|July 21, 2001
Structure determination at the atomic level from dynamical electron diffraction data under systematic row conditionsL J Allen, M P OxleyUltramicroscopy|April 20, 2001
Dark field X-ray microscopy: the effects of condenser/detector apertureS Vogt, H N Chapman, C Jacobsen, et al.Ultramicroscopy|February 24, 2001
Spin-column isolation of DNA-protein interactions from complex protein mixtures for AFM imagingP R Hoyt, M J Doktycz, R J Warmack, et al.Pageof 460