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Ultramicroscopy|February 24, 2001
Thermomechanical noise of a free v-shaped cantilever for atomic-force microscopyR W Stark, T Drobek, W M Heckl
Ultramicroscopy|May 11, 2000
A storage Dewar near-field scanning optical microscopeEytan, Yayon, Bar-Joseph, et al.
Ultramicroscopy|May 11, 2000
Comparison of electron diffraction data from non-linear optically active organic DMABC crystals obtained at 100 and 300 kVVoigt-Martin, Kothe, Yakimansky, et al.
Ultramicroscopy|May 11, 2000
Preparation of damage-free glass TEM specimensKestel
Ultramicroscopy|May 11, 2000
Incoherent imaging with the soft X-ray microscopeBurge, Yuan, Morrison, et al.
Ultramicroscopy|May 11, 2000
A practical simulated annealing program and its application to quantitative CBED pattern matchingLi, Wu, Zhu
Ultramicroscopy|May 2, 2001
Surface damage formation during ion-beam thinning of samples for transmission electron microscopyJ P McCaffrey, M W Phaneuf, L D Madsen
Ultramicroscopy|June 8, 2001
Quantitative high-resolution microscopy on a suspended chain of gold atomsH Koizumi, Y Oshima, Y Kondo, et al.
Ultramicroscopy|June 8, 2001
High-angle annular dark-field STEM observation of Xe nanocrystals embedded in AlK Mitsuishi, M Kawasaki, M Takeguchi, et al.
Ultramicroscopy|June 8, 2001
Structure determination and structure refinement of Al2CuMg precipitates by quantitative high-resolution electron microscopyR Kilaas, V Radmilovic
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