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Ultramicroscopy|March 22, 2005
Alloy liquid metal ion sources and their application in mass separated focused ion beamsL BischoffUltramicroscopy|March 22, 2005
Imaging and characterization of fine gamma' precipitates in a commercial nickel-base superalloyP M Sarosi, G B Viswanathan, D Whitis, et al.Ultramicroscopy|July 28, 2005
A practical method to detect and correct for lens distortion in the TEMGian Carlo Capitani, Peter Oleynikov, Sven Hovmöller, et al.Ultramicroscopy|June 7, 2005
Observation of HOPG by STM and contact AFM in various gas atmospheres under pressures up to 1.1 MPaYasumasa Suzuki, Hirotoshi Enoki, Etsuo AkibaUltramicroscopy|June 18, 2005
Phase contrast and DIC illumination for AFM hybridsRobert A Lugmaier, Thorsten Hugel, Martin Benoit, et al.Ultramicroscopy|August 2, 2005
Theoretical discussions on the geometrical phase analysisJ L Rouvière, E SarigiannidouUltramicroscopy|August 2, 2005
Diagnosis of aberrations from crystalline samples in scanning transmission electron microscopyQuentin M Ramasse, Andrew L BlelochUltramicroscopy|July 6, 2005
Calculations of HREM image intensity using Monte Carlo integrationL Y Chang, R R Meyer, A I KirklandUltramicroscopy|August 30, 2005
Interpretation of Oxygen K pre-edge peak in complex oxidesNan Jiang, John C H SpenceUltramicroscopy|August 30, 2005
Differential algebraic method for aberration analysis of typical electrostatic lensesZhixiong LiuPageof 460