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Ultramicroscopy|December 19, 2020
Accurate measurement of strain at interfaces in 4D-STEM: A comparison of various methodsChristoph Mahr, Knut Müller-Caspary, Tim Grieb, et al.
Ultramicroscopy|June 16, 2021
Resistivity contrast imaging in semiconductor structures using ultra-low energy scanning electron microscopyIwona Jóźwik, Jacek Jagielski, Ewa Dumiszewska, et al.
Ultramicroscopy|January 1, 1985
Photoelectron imaging of cytoskeletal elementsK K Nadakavukaren, O H Griffith
Ultramicroscopy|October 30, 2020
Influence of lens aberrations, specimen thickness and tilt on differential phase contrast STEM imagesJulius Bürger, Thomas Riedl, Jörg K N Lindner
Ultramicroscopy|October 31, 2020
Atom probe tomography quantification of carbon in siliconP Dumas, S Duguay, J Borrel, et al.
Ultramicroscopy|October 31, 2020
An in-situ method for protecting internal cracks/pores from ion beam damage and reducing curtaining for TEM sample preparation using FIBXiang Li Zhong, Sarah J Haigh, Xiaorong Zhou, et al.
Ultramicroscopy|June 19, 2022
Enhancing classification in correlative microscopy using multiple classifier systems with dynamic selectionSamuel Bitrus, Harald Fitzek, Eugen Rigger, et al.
Ultramicroscopy|May 14, 2022
Reconstructing dual-phase nanometer scale grains within a pearlitic steel tip in 3D through 4D-scanning precession electron diffraction tomography and automated crystal orientation mappingPatrick Harrison, Xuyang Zhou, Saurabh Mohan Das, et al.
Ultramicroscopy|May 18, 2022
Data synchronization in operando gas and heating TEMFan Zhang, Merijn Pen, Ronald G Spruit, et al.
Ultramicroscopy|July 26, 2021
Experimental realization of a π/2 vortex mode converter for electrons using a spherical aberration correctorT Schachinger, P Hartel, P-H Lu, et al.
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