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Ultramicroscopy|April 29, 2008
Reproducible tip fabrication and cleaning for UHV STMZ Q Yu, C M Wang, Y Du, et al.Ultramicroscopy|April 12, 2008
Bloch wave analysis of the Eshelby twist contrast around end-on screw dislocations in bcc MoB G Mendis, K J HemkerUltramicroscopy|December 25, 2007
A phenomenological model of fluctuation electron microscopy for a nanocrystal/amorphous compositeW G Stratton, P M VoylesUltramicroscopy|June 13, 2008
Structural properties of 0.65Pb(Mg1/3Nb2/3)O3-0.35PbTiO3 relaxor ferroelectric thin films on SrRuO3 conducting oxidesJi Hye Lee, Mi Ri Choi, William Jo, et al.Ultramicroscopy|June 14, 2008
Nanoscopic observation of a gold nanoparticle-conjugated protein using near-field scanning optical microscopyHyun Kyu Park, Yong Taik Lim, Jin Kyeong Kim, et al.Ultramicroscopy|June 3, 2008
Explanation and correction of false step heights in amplitude modulation atomic force microscopy measurements on alkane filmsM Bai, S Trogisch, S Magonov, et al.Ultramicroscopy|June 10, 2008
High-resolution wave field reconstruction using a through-focus series of images taken under limited electron doseT Nomaguchi, Y Kimura, Yoshizo TakaiUltramicroscopy|January 16, 2021
Charting the low-loss region in electron energy loss spectroscopy with machine learningLaurien I Roest, Sabrya E van Heijst, Louis Maduro, et al.Ultramicroscopy|January 22, 2021
Differential electron yield imaging with STXMWilliam A Hubbard, Jared J Lodico, Xin Yi Ling, et al.Ultramicroscopy|January 23, 2021
Evaluation of microstructure and conductivity of two-phase materials by the scanning spreading resistance microscopy (the case of shungite)I V Antonets, Ye A Golubev, V I ShcheglovPageof 460