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Ultramicroscopy|March 31, 2019
Effect of tip shape on nanomechanical properties measurements using AFMQuang Dang Nguyen, Koo-Hyun ChungUltramicroscopy|April 23, 2017
Statistical analysis of dislocations and dislocation boundaries from EBSD dataC Moussa, M Bernacki, R Besnard, et al.Ultramicroscopy|April 16, 2017
Recovery of quantum efficiency in spin-polarized photocathodes by atomic hydrogen cleaningXiuguang Jin, Masao Suzuki, Tsuneo Yasue, et al.Ultramicroscopy|October 27, 2018
High dose efficiency atomic resolution imaging via electron ptychographyTimothy J Pennycook, Gerardo T Martinez, Peter D Nellist, et al.Ultramicroscopy|July 14, 2019
Modeling and simulation of contact parameters of elliptical and cubic nanoparticles to be used in nanomanipulation based on atomic force microscopeM H Korayem, H Khaksar, H J SharahiUltramicroscopy|July 14, 2019
Correlated TKD/EDS - TEM - APT analysis on selected interfaces of CoSi2 thin filmsH Zschiesche, A P C Campos, C Dominici, et al.Ultramicroscopy|April 7, 2019
Quantitative STEM imaging of electron beam induced mass loss of epoxy resin sectionsRadim Skoupy, Jana Nebesarova, Miroslav Slouf, et al.Ultramicroscopy|January 23, 2017
TEM sample preparation by femtosecond laser machining and ion milling for high-rate TEM straining experimentsThomas Voisin, Michael D Grapes, Yong Zhang, et al.Ultramicroscopy|January 23, 2017
Analysis the effect of different geometries of AFM's cantilever on the dynamic behavior and the critical forces of three-dimensional manipulationMoharam Habibnejad Korayem, Maniya B Saraie, Mahdieh B SaraeeUltramicroscopy|November 15, 2016
Liquid-solid phase transition of Ge-Sb-Te alloy observed by in-situ transmission electron microscopyKatja Berlin, Achim TrampertPageof 460