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Ultramicroscopy|June 20, 2020
Corrigendum to: "Relative merits and limiting factors for x-ray and electron microscopy of thick, hydrated organic materials" [Ultramicroscopy 184 (2018) 293-309]Ming Du, Chris Jacobsen
Ultramicroscopy|February 13, 2023
A reference-area-free strain mapping method using precession electron diffraction dataDexin Zhao, Aniket Patel, Aaron Barbosa, et al.
Ultramicroscopy|November 19, 2022
Reconstructing the exit wave of 2D materials in high-resolution transmission electron microscopy using machine learningMatthew Helmi Leth Larsen, Frederik Dahl, Lars P Hansen, et al.
Ultramicroscopy|February 15, 2023
Simulations of magnetic Bragg scattering in transmission electron microscopyJustyn Snarski-Adamski, Alexander Edström, Paul Zeiger, et al.
Ultramicroscopy|February 22, 2023
Measurement of the pattern shifts for HR-EBSD with larger lattice rotationsWei Li, Yongzhe Wang, Xingui Zhou, et al.
Ultramicroscopy|March 4, 2025
Using non-parametric statistical testing to quantify solute clustering in atom probe reconstructionsWilliam J Davids, Mengwei He, Huma Bilal, et al.
Ultramicroscopy|January 25, 2025
A comparison of energy dispersive spectroscopy in transmission scanning electron microscopy with scanning transmission electron microscopyJennifer L W Carter, Tugce Karakulak Uz, Buhari Ibrahim, et al.
Ultramicroscopy|January 21, 2025
Effects of laser wavelength and pulse energy on the evaporation behavior of TiN coatings in atom probe tomography: A multi-instrument studyMaximilian Schiester, Helene Waldl, Katherine P Rice, et al.
Ultramicroscopy|October 31, 2024
A high-performance reconstruction method for partially coherent ptychographyWenhui Xu, Shoucong Ning, Pengju Sheng, et al.
Ultramicroscopy|November 10, 2024
Towards atom counting from first moment STEM images: Methodology and possibilitiesYansong Hao, Annick De Backer, Scott David Findlay, et al.
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