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Ultramicroscopy|November 8, 2024
A simple circularity-based approach for nanoparticle size histograms beyond the spherical approximationFlorent TournusUltramicroscopy|November 27, 2024
Direct electron detection for EBSD of low symmetry & beam sensitive ceramicsNicolò M Della Ventura, Andrew R Ericks, McLean P Echlin, et al.Ultramicroscopy|November 24, 2024
Chinese knot inspired isotropic linear scanning method for improved imaging performance in AFMXiaolong Jia, Haitao Wu, Qubo Jiang, et al.Ultramicroscopy|March 20, 2025
Direct observation of oxygen vacancy ordering evolution in cerium oxide at varying concentrations via high-resolution transmission electron microscopyYong Ding, Yuzi Liu, Yu Chen, et al.Ultramicroscopy|March 9, 2025
aquaDenoising: AI-enhancement of in situ liquid phase STEM video for automated quantification of nanoparticles growthAdrien Moncomble, Damien Alloyeau, Maxime Moreaud, et al.Ultramicroscopy|October 18, 2024
The reference window for reduced perturbation of the reference wave in electrical biasing off-axis electron holographyTolga Wagner, Robin Kraft, Franz Nowak, et al.Ultramicroscopy|October 16, 2024
Principle of TEM alignment using convolutional neural networks: Case study on condenser aperture alignmentLoïc Grossetête, Cécile Marcelot, Christophe Gatel, et al.Ultramicroscopy|August 10, 2024
Optimization of three-dimensional electron diffuse scattering data acquisitionRomy Poppe, Joke HadermannUltramicroscopy|August 2, 2024
Probing the interaction range of electron beam-induced etching in STEM by a non-contact electron beamStefan Manuel Noisternig, Christian Rentenberger, Christoph Gammer, et al.Ultramicroscopy|June 17, 2024
New Poisson denoising method for pulse-count STEM imagingTaichi Kusumi, Shun Katakami, Ryo Ishikawa, et al.Pageof 460