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Ultramicroscopy|June 6, 2023
Real-time simulations of ADF STEM probe position-integrated scattering cross-sections for single element fcc crystals in zone axis orientation using a densely connected neural networkI Lobato, A De Backer, S Van AertUltramicroscopy|June 9, 2023
Cones and spirals: Multi-axis acquisition for scalar and vector electron tomographyGeorge R Lewis, Emilie Ringe, Paul A MidgleyUltramicroscopy|June 14, 2023
Cryogenic spectroscopic imaging scanning tunnelling microscope in a water-cooled magnet down to 1.7 KKesen Zhao, Jing Zhang, Wenjie Meng, et al.Ultramicroscopy|October 2, 2023
Process optimization of broad ion beam milling for preparation of coating cross-sectionsNils Timmermans, Mike van Meer, Remco Okhuijsen, et al.Ultramicroscopy|September 9, 2023
TEM-EDS microanalysis: Comparison among the standardless, Cliff & Lorimer and absorption correction quantification methodsRoberto Conconi, Gennaro Ventruti, Fernando Nieto, et al.Ultramicroscopy|June 17, 2023
Quantitative comparison of excitation modes of tuning forks for shear force in probe microscopyV V Tkachuk, J P Korterik, H L OfferhausUltramicroscopy|June 19, 2023
Characterization of a Timepix detector for use in SEM acceleration voltage rangeNikita Denisov, Daen Jannis, Andrey Orekhov, et al.Ultramicroscopy|February 27, 2026
An empirical X-ray K-Ratio framework for thickness measurement of 2D Si and SiO₂ thin films and SiO2 layer on Si substrateAhmad M D Assa'd Jaber, Adel A Shaheen, Maryam W N Al-Mazaydeh, et al.Ultramicroscopy|February 27, 2026
Systematic correction of core-loss spectra via machine learning: bridging the gap between simulated and experimental spectraYinan Wang, Yu Fujikata, Louis Wong, et al.Ultramicroscopy|April 28, 2026
Noise estimation and suppression in quantitative EMCD measurementsHitoshi Makino, Bernd Rellinghaus, Sebastian Schneider, et al.Pageof 460