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Ultramicroscopy|June 29, 2004
Imaging a dense nanodot assembly by phase retrieval from TEM imagesP Donnadieu, M Verdier, G Berthomé, et al.Ultramicroscopy|March 30, 2004
The contribution of phonon scattering to high-resolution images measured by off-axis electron holographyC B Boothroyd, R E Dunin-BorkowskiUltramicroscopy|June 26, 2007
Using defined structures on very thin foils for characterizing AFM tipsT Machleidt, K-H Franke, H Romanus, et al.Ultramicroscopy|December 5, 2006
A straightforward specimen holder modification for remnant magnetic-field measurement in TEMJ W Lau, M A Schofield, Y ZhuUltramicroscopy|July 6, 2006
Bright-field TEM imaging of single molecules: dream or near future?Marek Malac, Marco Beleggia, Ray Egerton, et al.Ultramicroscopy|November 26, 2008
The statistics of the thermal motion of the atoms during imaging process in transmission electron microscopy and related techniquesAxel Rother, Thomas Gemming, Hannes LichteUltramicroscopy|February 10, 2009
Effects of electron channeling in HAADF-STEM intensity in La2CuSnO6M Haruta, H Kurata, H Komatsu, et al.Ultramicroscopy|January 24, 2009
Failure mechanisms of silicon-based atom-probe tipsS Kölling, W VandervorstUltramicroscopy|February 13, 2010
A novel AFM based method for force measurements between individual hair strandsEva Max, Wolfgang Häfner, Frank Wilco Bartels, et al.Ultramicroscopy|July 3, 2026
Unsupervised deep image prior for sparse-view and limited-angle electron tomographySerge Brosset, Daniel Del Pozo Bueno, Thomas David, et al.Pageof 460