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Ultramicroscopy|September 13, 2020
Approximant-based orientation determination of quasicrystals using electron backscatter diffractionGrzegorz Cios, Gert Nolze, Aimo Winkelmann, et al.
Ultramicroscopy|January 1, 1984
The "quasi-thermal" mechanism for electron beam damage of n-paraffinsD L Dorset, F M Holland, J R Fryer
Ultramicroscopy|July 1, 1992
Scanning force microscopy studies of the S-layers from Bacillus coagulans E38-66, Bacillus sphaericus CCM2177 and of an antibody binding processF Ohnesorge, W M Heckl, W Häberle, et al.
Ultramicroscopy|August 6, 2026
Drift correction of scan images by snapshot referencingZac Thollar, Kanto Maeda, Tetsuya Kubota, et al.
Ultramicroscopy|October 7, 2026
Study on nonlinear spatial stitching method of SICM images based on adaptive region candidatesXiaobo Liao, Wenlin Wu, Zhiwu Wang, et al.
Ultramicroscopy|September 4, 2026
A variational method based post-processing framework for high-fidelity EBSD grain-detection refinementXu Zhang, Haitao Zhao, Junheng Gao, et al.
Ultramicroscopy|October 1, 2026
Picometre-scale real-time drift correction in TEM and STEM by dynamic control of the specimen stage for atomic-resolution imagingChristophe Gatel, Julien Dupuy, Teresa Hungria, et al.
Ultramicroscopy|October 2, 2026
Conceptual design of a monochromated scanning electron microscopy-based reflection electron energy loss spectroscopy system for surface nanospectroscopyTakashi Ogawa, Jeong-Woong Lee, Junhyeok Hwang, et al.
Ultramicroscopy|October 27, 2026
Scan-coil delay causes anisotropic signal loss in fast 4D-STEMVishal Kumar, Andreas Jehle, Tizian Lorenzen, et al.
Ultramicroscopy|October 27, 2026
Controlling charge, energy spread, and pulse duration in an ultrafast scanning electron microscopeTomáš Chlouba, Magdalena Solà-Garcia, Nika van Nielen, et al.
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