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Ultramicroscopy|December 18, 2010
Optimisation of mass ranging for atom probe microanalysis and application to the corrosion processes in Zr alloysD Hudson, G D W Smith, B GaultUltramicroscopy|December 17, 2010
Evaporation mechanisms of MgO in laser assisted atom probe tomographyB Mazumder, A Vella, B Deconihout, et al.Ultramicroscopy|March 1, 2011
Direct oxygen imaging within a ceramic interface, with some observations upon the dark contrast at the grain boundaryS D Findlay, S Azuma, N Shibata, et al.Ultramicroscopy|March 1, 2011
Imaging modes for potential mapping in semiconductor devices by electron holography with improved lateral resolutionJan Sickmann, Petr Formánek, Martin Linck, et al.Ultramicroscopy|February 8, 2011
Atom probe tomography of Ni-base superalloys Allvac 718Plus and Alloy 718L Viskari, K StillerUltramicroscopy|February 8, 2011
Characteristics of a high brightness gaseous field ion source employing tungsten-carbon doped NiAl needlesMarwan S MousaUltramicroscopy|February 22, 2011
Force-gradient-induced mechanical dissipation of quartz tuning fork force sensors used in atomic force microscopyA Castellanos-Gomez, N Agraït, G Rubio-BollingerUltramicroscopy|February 22, 2011
Application of Delaunay tessellation for the characterization of solute-rich clusters in atom probe tomographyW Lefebvre, T Philippe, F VurpillotUltramicroscopy|February 22, 2011
Atom probe tomography and transmission electron microscopy of a Mg-doped AlGaN/GaN superlatticeS E Bennett, R M Ulfig, P H Clifton, et al.Ultramicroscopy|February 22, 2011
Dark field electron holography for strain measurementA Béché, J L Rouvière, J P Barnes, et al.Pageof 459