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Ultramicroscopy|January 20, 2009
Tomographic spectroscopic imaging; an experimental proof of conceptW Van den Broek, J Verbeeck, D Schryvers, et al.Ultramicroscopy|January 20, 2009
A rapid method to correct objective lens astigmatism in a TEMQ Xing, T A LograssoUltramicroscopy|January 31, 2009
Laser-assisted atom probe analysis of sol-gel silica layersM Gruber, C Oberdorfer, P Stender, et al.Ultramicroscopy|March 19, 2005
Dip Pen Nanolithography (DPN): process and instrument performance with NanoInk's NSCRIPTOR systemJason Haaheim, Ray Eby, Mike Nelson, et al.Ultramicroscopy|March 19, 2005
Analysis of the measured signals in apertureless near-field optical microscopyF Formanek, Y De Wilde, L AigouyUltramicroscopy|March 19, 2005
On the measurement of lattice parameters in a collection of nanoparticles by transmission electron diffractionC T Schamp, W A JesserUltramicroscopy|September 6, 2005
Electron diffraction analysis of individual single-walled carbon nanotubesJannik C Meyer, Matthieu Paillet, Georg S Duesberg, et al.Ultramicroscopy|October 24, 2007
Safe fabrication of sharp gold tips for light emission in scanning tunnelling microscopyMichael G Boyle, Lei Feng, P DawsonUltramicroscopy|August 19, 2007
Magnetic circular dichroism in EELS: towards 10 nm resolutionPeter Schattschneider, Cécile Hébert, Stefano Rubino, et al.Pageof 460