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Ultramicroscopy
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January 20, 2009
Tomographic spectroscopic imaging; an experimental proof of concept
W Van den Broek, J Verbeeck, D Schryvers, et al.
Ultramicroscopy
|
January 20, 2009
A rapid method to correct objective lens astigmatism in a TEM
Q Xing, T A Lograsso
Ultramicroscopy
|
January 31, 2009
Laser-assisted atom probe analysis of sol-gel silica layers
M Gruber, C Oberdorfer, P Stender, et al.
Ultramicroscopy
|
March 19, 2005
Dip Pen Nanolithography (DPN): process and instrument performance with NanoInk's NSCRIPTOR system
Jason Haaheim, Ray Eby, Mike Nelson, et al.
Ultramicroscopy
|
March 19, 2005
Analysis of the measured signals in apertureless near-field optical microscopy
F Formanek, Y De Wilde, L Aigouy
Ultramicroscopy
|
March 19, 2005
On the measurement of lattice parameters in a collection of nanoparticles by transmission electron diffraction
C T Schamp, W A Jesser
Ultramicroscopy
|
September 6, 2005
Electron diffraction analysis of individual single-walled carbon nanotubes
Jannik C Meyer, Matthieu Paillet, Georg S Duesberg, et al.
Ultramicroscopy
|
October 24, 2007
Safe fabrication of sharp gold tips for light emission in scanning tunnelling microscopy
Michael G Boyle, Lei Feng, P Dawson
Ultramicroscopy
|
August 19, 2007
Magnetic circular dichroism in EELS: towards 10 nm resolution
Peter Schattschneider, Cécile Hébert, Stefano Rubino, et al.
Ultramicroscopy
|
August 19, 2007
Coulomb interactions in Ga LMIS
Tomás Radlicka, Bohumila Lencová
Page
of 458
Search research articles
Search
Showing results (621-630 of 4,574) with videos related to
Sort By:
Page
of 458
Ultramicroscopy
|
January 20, 2009
Tomographic spectroscopic imaging; an experimental proof of concept
W Van den Broek, J Verbeeck, D Schryvers, et al.
Ultramicroscopy
|
January 20, 2009
A rapid method to correct objective lens astigmatism in a TEM
Q Xing, T A Lograsso
Ultramicroscopy
|
January 31, 2009
Laser-assisted atom probe analysis of sol-gel silica layers
M Gruber, C Oberdorfer, P Stender, et al.
Ultramicroscopy
|
March 19, 2005
Dip Pen Nanolithography (DPN): process and instrument performance with NanoInk's NSCRIPTOR system
Jason Haaheim, Ray Eby, Mike Nelson, et al.
Ultramicroscopy
|
March 19, 2005
Analysis of the measured signals in apertureless near-field optical microscopy
F Formanek, Y De Wilde, L Aigouy
Ultramicroscopy
|
March 19, 2005
On the measurement of lattice parameters in a collection of nanoparticles by transmission electron diffraction
C T Schamp, W A Jesser
Ultramicroscopy
|
September 6, 2005
Electron diffraction analysis of individual single-walled carbon nanotubes
Jannik C Meyer, Matthieu Paillet, Georg S Duesberg, et al.
Ultramicroscopy
|
October 24, 2007
Safe fabrication of sharp gold tips for light emission in scanning tunnelling microscopy
Michael G Boyle, Lei Feng, P Dawson
Ultramicroscopy
|
August 19, 2007
Magnetic circular dichroism in EELS: towards 10 nm resolution
Peter Schattschneider, Cécile Hébert, Stefano Rubino, et al.
Ultramicroscopy
|
August 19, 2007
Coulomb interactions in Ga LMIS
Tomás Radlicka, Bohumila Lencová
Page
of 458