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Ultramicroscopy|September 4, 2018
An EELS signal-from-background separation algorithm for spectral line-scan/image quantificationSirong Lu, Kristy J Kormondy, Alexander A Demkov, et al.Ultramicroscopy|September 3, 2018
A temperature-controlled stage for laser scanning confocal microscopy and case studies in materials scienceDmytro Dedovets, Cécile Monteux, Sylvain DevilleUltramicroscopy|September 9, 2018
Spatially-incoherent annular illumination microscopy for bright-field optical sectioningXiao Ma, Zibang Zhang, Manhong Yao, et al.Ultramicroscopy|October 2, 2018
A vibration analysis of a cracked micro-cantilever in an atomic force microscope by using transfer matrix methodShahriar Dastjerdi, Mohammad AbbasiUltramicroscopy|October 3, 2018
Atomic resolution force imaging through the static deflection of the cantilever in simultaneous Scanning Tunneling/Atomic Force MicroscopyH Özgür ÖzerUltramicroscopy|June 24, 2018
Domain structures and Prco antisite point defects in double-perovskite PrBaCo2O5+δ and PrBa0.8Ca0.2Co2O5+δYong Ding, Yu Chen, Ken C Pradel, et al.Ultramicroscopy|May 21, 2019
Damage-induced voltage alteration (DIVA) contrast in SEM images of ion-irradiated semiconductorsIwona Jóźwik, Adam Barcz, Elżbieta Dąbrowska, et al.Ultramicroscopy|May 25, 2019
Data-driven computational method for determining accurate analytical field solutions on arbitrary-geometry spectrometersJin Ming Koh, Kang Hao CheongUltramicroscopy|October 10, 2018
360° multiparametric imaging atomic force microscopy: A method for three-dimensional nanomechanical mappingHaojian Lu, Yongbing Wen, Hao Zhang, et al.Ultramicroscopy|October 25, 2021
Electron crystallography of chiral and non-chiral small moleculesWeijiang Zhou, Benjamin Bammes, Patrick G Mitchell, et al.Pageof 460