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Ultramicroscopy|February 15, 2023
Solving the crystallographic phase problem using dynamical scattering in electron diffractionChristoph T KochUltramicroscopy|January 29, 2023
Cluster characterization in atom probe tomography: Machine learning using multiple summary functionsRoland A Bennett, Andrew P Proudian, Jeramy D ZimmermanUltramicroscopy|February 24, 2023
Machine learning based de-noising of electron back scatter patterns of various crystallographic metallic materials fabricated using laser directed energy depositionK V Mani Krishna, R Madhavan, Mangesh V Pantawane, et al.Ultramicroscopy|November 12, 2025
Accurate grain boundary plane distributions for textured microstructures from stereological analysis of orthogonal two-dimensional electron backscatter diffraction orientation mapsMartin Folwarczny, Ao Li, Rushvi Shah, et al.Ultramicroscopy|January 1, 1985
A determination of thickness and surface relief in reembedded sections of an epoxy- and a melamine-resin containing ferritin as size standardD Frösch, C Westphal, K BachhuberUltramicroscopy|October 22, 2025
Laser-induced electron beam emission from titanium dioxide on silicon photocathodes treated with cesium and barium oxideC W Johnson, L Hess, J Schwede, et al.Ultramicroscopy|November 8, 2025
A new approach to SEM in-situ thermomechanical experiments through automationA D Smith, D Lunt, M Taylor, et al.Ultramicroscopy|October 11, 2025
Ultra-thin plan-view lamella made by focused ion beamMengkun Tian, Jingli Cheng, Nashrah Afroze, et al.Ultramicroscopy|September 28, 2025
Investigating the convergence properties of iterative ptychography for atomic-resolution low-dose imagingTamazouzt Chennit, Songge Li, Hoelen L Lalandec Robert, et al.Ultramicroscopy|September 16, 2025
Novel technique for aluminum thin film thickness measurement using top view SEM-EDX in conjunction with electron beam simulation and machine learningTahsinul Huq, Yew Hoong Wong, Joon Huang Chuah, et al.Pageof 460