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Chuang Wang, Xu Li, Gang Zhou
Yifan Zhang, Bing Luo, Mingli Fu
Chi Chen, Qing Sun, Chuang Wang

<em>In Situ</em> Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
Published on : Jun 26, 2015

Magnet Assisted Composite Manufacturing: A Flexible New Technique for Achieving High Consolidation Pressure in Vacuum Bag/Lay-Up Processes
Published on : May 17, 2018

Evaluation of the Curing of Adhesive Systems by Rheological and Thermal Testing
Published on : Jul 03, 2020