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Chi Su

1PUBLICATIONS
0CO-AUTHORS
Electrical energy generation (incl. renewables, excl. photovoltaics)
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Publications (1)

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|May 03, 2020
Test Pattern Design for Plasma Induced Damage on Inter-Metal Dielectric in FinFET Cu BEOL Processes.

Chi Su, Yi-Pei Tsai, Chrong-Jung Lin

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