Szilvia Kalácska

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0CO-AUTHORS
Nonlinear optics and spectroscopy
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Publications (1)

|Nov 23, 2020
In Situ Atomic Force Microscopy Depth-Corrected Three-Dimensional Focused Ion Beam Based Time-of-Flight Secondary Ion Mass Spectroscopy: Spatial Resolution, Surface Roughness, Oxidation.

Lex Pillatsch, Szilvia Kalácska, Xavier Maeder

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