Hui Dai

1PUBLICATIONS
3CO-AUTHORS
Instruments and techniques
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Publications (1)

|Nov 13, 2025
Non-Destructive Evaluation of Damage and Electricity Characteristics in 4H-SiC Induced by Ion Irradiation via Raman Spectroscopy.

Hui Dai, Zhiyan Hou, Xinqing Han

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Frequent Collaborators

1 joint publications

Jiacheng Liang

1 joint publications

Yong Liu

1 joint publications

Xuelin Wang