Hwarim Im

1PUBLICATIONS
2CO-AUTHORS
Photovoltaic power systems
Featured researcher

Get your video featured.

JoVEPublish with JoVE
Journal

Publications (1)

|Dec 08, 2022
Effect of Back-Channel Surface on Reliability of Solution-Processed In<sub>0.51</sub>Ga<sub>0.15</sub>Zn<sub>0.34</sub>O Thin-Film Transistors with Thin Active Layer.

Hwarim Im, Jeong Hyun Ahn, Yong-Sang Kim

Pageof 1

Frequent Collaborators

1 joint publications

Yong-Sang Kim

1 joint publications

Yongtaek Hong