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M Ilchen, G Hartmann, E V Gryzlova+30
E Allaria
C Callegari
R Cucini
A Knie
F Scholz
M Zangrando
<em>In Situ</em> Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
Published on : Jun 26, 2015