Krzysztof Gajewski
2PUBLICATIONS
10CO-AUTHORS
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Publications (2)
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|Sep 14, 2024
Conductive Atomic Force Microscopy-Ultralow-Current Measurement Systems for Nanoscale Imaging of a Surface's Electrical Properties.Andrzej Sikora, Krzysztof Gajewski, Dominik Badura
|Dec 08, 2021
Influence of B/N co-doping on electrical and photoluminescence properties of CVD grown homoepitaxial diamond films.Srinivasu Kunuku, Mateusz Ficek, Aleksandra Wieloszynska
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Frequent Collaborators
1 joint publications
Srinivasu Kunuku
1 joint publications
Mateusz Ficek
1 joint publications
Magdalena Tamulewicz-Szwajkowska
1 joint publications
Jacek Ryl
1 joint publications
Tedor Gotszalk
1 joint publications
Robert Bogdanowicz
1 joint publications
Andrzej Sikora
1 joint publications
Dominik Badura
1 joint publications
Bartosz Pruchnik
1 joint publications
Tomasz Piasecki
