Yung-Chia Chang

1PUBLICATIONS

2CO-AUTHORS

Manufacturing safety and quality

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Publications (1)

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|Aug 29, 2024

A Novel Out-of-Control Action Plan (OCAP) for Optimizing Efficiency and Quality in the Wafer Probing Process for Semiconductor Manufacturing.

Woonyoung Yeo, Yung-Chia Chang, Liang-Ching Chen

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Frequent Collaborators

1 joint publications

Liang-Ching Chen

1 joint publications

Kuei-Hu Chang

Frequent Collaborators

1 joint publications

Liang-Ching Chen

1 joint publications

Kuei-Hu Chang