Jing Chang

2PUBLICATIONS
5CO-AUTHORS
MicroelectronicsElemental semiconductors
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Publications (2)

|May 27, 2026
Atomic Force Microscopy (AFM)-Based Metrology for Advanced Etching in Three-Dimensional Integrated Circuits.

|Mar 04, 2021
Probing Specific Adsorption of Electrolytes at Kaolinite-Aqueous Interfaces by Atomic Force Microscopy.

Jing Chang, Bo Liu, James S Grundy

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Frequent Collaborators

1 joint publications

Bo Liu

1 joint publications

Rogerio Manica

1 joint publications

Zhen Li

1 joint publications

Qingxia Liu