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Jing Chang

2PUBLICATIONS

5CO-AUTHORS

MicroelectronicsElemental semiconductors

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Publications (2)

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|May 27, 2026

Atomic Force Microscopy (AFM)-Based Metrology for Advanced Etching in Three-Dimensional Integrated Circuits.

|Mar 04, 2021

Probing Specific Adsorption of Electrolytes at Kaolinite-Aqueous Interfaces by Atomic Force Microscopy.

Jing Chang, Bo Liu, James S Grundy

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Frequent Collaborators

1 joint publications

Bo Liu

1 joint publications

Rogerio Manica

1 joint publications

Zhen Li

1 joint publications

Qingxia Liu

1 joint publications

Zhenghe Xu

Frequent Collaborators

1 joint publications

Bo Liu

1 joint publications

Rogerio Manica

1 joint publications

Zhen Li

1 joint publications

Qingxia Liu