Jan G Gluschke

2PUBLICATIONS
5CO-AUTHORS
Nanoscale characterisationNanoelectronics
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Publications (2)

|Nov 22, 2022
Systematic in situ hydration neutron reflectometry study on Nafion thin films.

Hamish Cavaye, Rebecca J L Welbourn, Jan G Gluschke

|Oct 02, 2020
Impact of invasive metal probes on Hall measurements in semiconductor nanostructures.

Jan G Gluschke, Jakob Seidl, H Hoe Tan

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