Youngpak Lee

2PUBLICATIONS
4CO-AUTHORS
Organic semiconductorsNanoscale characterisation
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Publications (2)

|May 13, 2025
Ellipsometric Surface Oxidation Model of ALD-Grown Vanadium Oxide Mixed-Valence System.

Xiaojie Sun, Shuguang Wang, Qingyuan Cai

|Feb 11, 2023
Interpretation of Reflection and Colorimetry Characteristics of Indium-Particle Films by Means of Ellipsometric Modeling.

Hao-Tian Zhang, Rong He, Lei Peng

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