Stefan Kowarik

7PUBLICATIONS
16CO-AUTHORS
Instruments and techniquesElemental semiconductorsCondensed matter characterisation technique developmentNanoscale characterisationModelling and simulation
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Publications (7)

|Aug 06, 2026
Microsecond X-ray reflectometry.

|Sep 18, 2024
Laser-induced tuning of crystallization in tetracene thin films.

Andika Asyuda, Johannes Müller, Mohammad Fardin Gholami

|Apr 10, 2024
Neural network analysis of neutron and X-ray reflectivity data incorporating prior knowledge.

Valentin Munteanu, Vladimir Starostin, Alessandro Greco

|Apr 10, 2024
Millisecond X-ray reflectometry and neural network analysis: unveiling fast processes in spin coating.

David Schumi-Mareček, Florian Bertram, Petr Mikulík

|Oct 18, 2023
Closing the loop: autonomous experiments enabled by machine-learning-based online data analysis in synchrotron beamline environments.

Linus Pithan, Vladimir Starostin, David Mareček

|Oct 17, 2022
Faster and lower-dose X-ray reflectivity measurements enabled by physics-informed modeling and artificial intelligence co-refinement.

David Mareček, Julian Oberreiter, Andrew Nelson

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Frequent Collaborators

3 joint publications

Alexander Hinderhofer

3 joint publications

Linus Pithan

3 joint publications

Frank Schreiber

2 joint publications

Alessandro Greco