Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Md Saiful Islam

1PUBLICATIONS

1CO-AUTHORS

Signal processing

Featured researcher

Get your video featured.

Publish with JoVE

Featured researcher

Get your video featured.

Publish with JoVE

Publications (1)

Sort by Publication Date:

|Apr 08, 2026

A hybrid system for detecting semiconductor wafer defects using modified MobileNet with multi-head attention.

Sharith Dhar, Fahmid Al Farid, Md Saiful Islam

Pageof 1

Frequent Collaborators

1 joint publications

Fahmid Al Farid

Frequent Collaborators

1 joint publications

Fahmid Al Farid

Top Related Videos

Artificial Intelligence-Based System for Detecting Attention Levels in Students

Artificial Intelligence-Based System for Detecting Attention Levels in Students

Published on : Dec 15, 2023

See more related videos

Top Related Videos

Artificial Intelligence-Based System for Detecting Attention Levels in Students

Artificial Intelligence-Based System for Detecting Attention Levels in Students

Published on : Dec 15, 2023

See more related videos