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Mário F S Ferreira, Gilberto Brambilla, Luc Thévenaz+20
Misha Sumetsky
Goretti G Hernandez-Cardoso
Enrique Castro Camus
Björn M Reinhard
Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on : Apr 01, 2020