Victor Soltwisch
11PUBLICATIONS
26CO-AUTHORS
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Publications (11)
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|May 14, 2025
Characterization and discrimination of periodic nanostructures with scanning-free GEXRF.Nils Wauschkuhn, Yves Kayser, Jonas Baumann
|Mar 25, 2025
Fabrication of shallow EUV gratings on silicon by irradiation with helium ions.J Kaufmann, R Ciesielski, K Freiberg
|Feb 10, 2025
Hybrid approach to reconstruct nanoscale grating dimensions using scattering and fluorescence with soft X-rays.Leonhard M Lohr, Richard Ciesielski, Vinh-Binh Truong
|Feb 01, 2023
A new sample chamber for hybrid detection of scattering and fluorescence, using synchrotron radiation in the soft x-ray and extreme ultraviolet (EUV) spectral range.Richard Ciesielski, Leonhard M Lohr, Analía Fernández Herrero
|Nov 11, 2022
Scan-Free GEXRF in the Soft X-ray Range for the Investigation of Structured Nanosamples.Steffen Staeck, Anna Andrle, Philipp Hönicke
|Oct 13, 2022
Challenges of grazing emission X-ray fluorescence (GEXRF) for the characterization of advanced nanostructured surfaces.Dieter Skroblin, Analía Fernández Herrero, Thomas Siefke
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Frequent Collaborators
7 joint publications
Philipp Hönicke
7 joint publications
Yves Kayser
4 joint publications
Anna Andrle
3 joint publications
Analía Fernández Herrero
3 joint publications
Thomas Siefke
3 joint publications
Konstantin V Nikolaev
2 joint publications
Richard Ciesielski
2 joint publications
Dieter Skroblin
2 joint publications
Jonas Baumann
2 joint publications
Frank Scholze
