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Victor Soltwisch

11PUBLICATIONS
26CO-AUTHORS
Nanoscale characterisationElemental semiconductorsMicro- and nanosystemsElectrical and electromagnetic methods in geophysicsNanofabrication, growth and self assembly
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Journal

Publications (11)

Sort by Publication Date:
|May 14, 2025
Characterization and discrimination of periodic nanostructures with scanning-free GEXRF.

Nils Wauschkuhn, Yves Kayser, Jonas Baumann

|Mar 25, 2025
Fabrication of shallow EUV gratings on silicon by irradiation with helium ions.

J Kaufmann, R Ciesielski, K Freiberg

|Feb 10, 2025
Hybrid approach to reconstruct nanoscale grating dimensions using scattering and fluorescence with soft X-rays.

Leonhard M Lohr, Richard Ciesielski, Vinh-Binh Truong

|Feb 01, 2023
A new sample chamber for hybrid detection of scattering and fluorescence, using synchrotron radiation in the soft x-ray and extreme ultraviolet (EUV) spectral range.

Richard Ciesielski, Leonhard M Lohr, Analía Fernández Herrero

|Nov 11, 2022
Scan-Free GEXRF in the Soft X-ray Range for the Investigation of Structured Nanosamples.

Steffen Staeck, Anna Andrle, Philipp Hönicke

|Oct 13, 2022
Challenges of grazing emission X-ray fluorescence (GEXRF) for the characterization of advanced nanostructured surfaces.

Dieter Skroblin, Analía Fernández Herrero, Thomas Siefke

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Frequent Collaborators

7 joint publications

Philipp Hönicke

7 joint publications

Yves Kayser

4 joint publications

Anna Andrle

3 joint publications

Analía Fernández Herrero

3 joint publications

Thomas Siefke

3 joint publications

Konstantin V Nikolaev

2 joint publications

Richard Ciesielski

2 joint publications

Dieter Skroblin

2 joint publications

Jonas Baumann

2 joint publications

Frank Scholze

Frequent Collaborators

7 joint publications

Philipp Hönicke

7 joint publications

Yves Kayser

4 joint publications

Anna Andrle

3 joint publications

Analía Fernández Herrero

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