C Barth

1PUBLICATIONS
2CO-AUTHORS
Electrical circuits and systems
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Publications (1)

|Apr 28, 2018
Quantitative correlation between the void morphology of niobium-tin wires and their irreversible critical current degradation upon mechanical loading.

C Barth, B Seeber, A Rack

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Frequent Collaborators

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A Rack

1 joint publications

C Senatore