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Christopher R Dillon, Alexis Farrer, Hailey McLean
Scott Almquist, Dennis L Parker, Douglas A Christensen

Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope
Published on : Sep 14, 2018

Evaluating Targeting Accuracy in the Focal Plane for an Ultrasound-guided High-intensity Focused Ultrasound Phased-array System
Published on : Mar 06, 2019