Gyeongyeop Lee
3PUBLICATIONS
3CO-AUTHORS
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Publications (3)
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|May 27, 2023
Performance Degradation in Static Random Access Memory of 10 nm Node FinFET Owing to Displacement Defects.Minji Bang, Jonghyeon Ha, Gyeongyeop Lee
|Aug 26, 2022
On-State Current Degradation Owing to Displacement Defect by Terrestrial Cosmic Rays in Nanosheet FET.Jonghyeon Ha, Gyeongyeop Lee, Hagyoul Bae
|Jun 24, 2022
Influence of Radiation-Induced Displacement Defect in 1.2 kV SiC Metal-Oxide-Semiconductor Field-Effect Transistors.Gyeongyeop Lee, Jonghyeon Ha, Kihyun Kim
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