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Xinxi Li
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Photovoltaic power systems
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Materials (Basel, Switzerland)
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May 27, 2026
The Effects of Electron-Beam-Radiation-Induced Damage on Single-Crystal Silicon Devices with SiO<sub>2</sub> Surface Passivation in a Nitrogen Atmosphere.
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Yisong Lei
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joint publications
Yongjun Xiang
Frequent Collaborators
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joint publications
Yisong Lei
1
joint publications
Yongjun Xiang
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